Doprava zdarma při nákupu nad 1 499 Kč přes Zásilkovnu nebo PPL Box.

Zjistit stav objednávky

Staňte se součástí komunity milovníků knih z celého světa a získejte hromadu výhod. Založit účet zdarma

Doprava zdarma se Zásilkovnou nad 1 499 Kč

Kurýr DPD 69 Kč PPL shop 49 Kč Balíkovna 69 Kč PPL kurýr 74 Kč PPL box 39 Kč Balíkovna 49 Kč Výdejní místo DPD 49 Kč Zásilkovna 39 Kč

Kontakt

Jak nakupovat

Pomoc

Můj účet

▸ Prázdný :-(

Doprava zdarma při nákupu nad 1 499 Kč přes Zásilkovnu nebo PPL Box.

A Fresh View on Impact Ionization Process: Multistage Scattering Model

Name: A Fresh View on Impact Ionization Process: Multistage Scattering Model
Brand: LAP Lambert Academic Publishing
SKU: 18377441
Price: 1014 CZK
Availability: InStock
Author: Aritra Acharyya
ISBN: 9783659932595

Estimation of Ionization Rates of Charge Carriers in Different Semiconductors and in Monolayer Graphene Nanoribbons

Aritra Acharyya

Jazyk

Angličtina

Kniha Brožovaná

Libristo kód: 18377441

Nakladatelství LAP Lambert Academic Publishing, listopad 2016

This book is presenting a new way of looking into the well-known impact ionization phenomena in reve... Celý popis

Libristo kód: 18377441

101 b

1 014 Kč

Skladem u dodavatele Odesíláme za 5-8 dnů

Až 30 dní na vrácení zboží

Zákazníci také koupili

Yukimura i Kei Kizu Natsuki

Brožovaná

166 Kč

Mosaique Medicale Ou Articles Extraits Des Journaux de la Societe Hahnemanienne LEBOUCHER-A

Brožovaná

336 Kč

Vier Monate VOR Paris 1870-1871 Belagerungstagebuch Eines Kriegsfreiwilligen Im Gardefüsilierregiment Otto Liebmann

Brožovaná

538 Kč

This book is presenting a new way of looking into the well-known impact ionization phenomena in reverse biased p-n junctions. It is intended as a text for postgraduate students in applied physics, electrical and electronics engineering and material science. It can exclusively serve as a reference for the scientists who are working in the area of semiconductor device simulation and modeling. The analytical approach of representing impact ionization phenomena based on multistage scattering model will be extremely helpful for the researchers working in the above-mentioned areas of research. The procedure of estimating the ionization rate of charge carriers in different semiconductors and monolayer grapheme nanoribbons via multistage scattering model has been presented in different chapters of this book. The influences of acoustic phonon scattering as well as externally applied steady magnetic field on the ionization rates has also been described in detail in subsequent chapters.