Kontakt
Jak nakupovat
Doručení
Nákupní rádce
Electromigration Inside Logic Cells
Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Angličtina
135 b
30 dní na vrácení zboží
Zákazníci také koupili
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.
Informace o knize
Angličtina
Kategorie
Darujte tuto knihu ještě dnes
Je to snadné
1 Přidejte knihu do košíku a zvolte doručit jako dárek 2 Obratem vám zašleme poukaz 3 Kniha dorazí na adresu obdarovanéhoMohlo by vás také zajímat
/
Brožovaná
1 077
Kč
/
Adobe ePub DRM
1 187
Kč
/
Brožovaná
1 046
Kč
/
Pevná
1 669
Kč
/
Brožovaná
637
Kč
Ahoj! Jsem Libroamiko, tvůj knižní rádce.
Jak ti můžu pomoct?