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Spectroscopic Ellipsometry - Principles and Applications

Name: Spectroscopic Ellipsometry - Principles and Applications
Brand: John Wiley & Sons Inc
SKU: 04878436
Price: 7466 CZK
Availability: InStock

Hiroyuki Fujiwara

Jazyk

Angličtina

Kniha Pevná

Libristo kód: 04878436

Nakladatelství John Wiley & Sons Inc, ledna 2007

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semicond... Celý popis

Libristo kód: 04878436

747 b

7 466 Kč

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Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.