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Structural Analysis of Point Defects in Solids
An Introduction to Multiple Magnetic Resonance Spectroscopy
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Strutural Analysis of Point Defects in Solids introduces the§principles and techniques of modern electron paramagnetic§resonance (EPR) spectroscopy essentialfor applications to§the determination of microscopic defect§structures. Investigations of the microscopic and electronic§structure, and also correlations with the§magnetic propertiesof solids, require various multiple§magnetic resonance methods, such as ENDOR and optically§detected EPR or ENDOR. This book discusses experimental,§technological and theoretical aspects of these techniques§comprehensively, from a practical viewpoint, with many§illustrative examples taken from semiconductors and other§solids. The nonspecialist is informed about the potential of§the different methods, while the researcher faced with the§task of determining defect structures isprovided with the§necessary tools, together with much information on§computer-aided methods of data analysis and the principles§of modern spectrometer design.
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